INFRARED INSPECTION OF BONDED SUBSTRATES
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United States of America Patent
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Issued Date -
Nov 15, 2012
app pub date -
Nov 16, 2010
filing date -
Nov 16, 2009
priority date (Note) -
Abandoned
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Abstract
A method and apparatus for obtaining inspection information is described. A standard CCD or CMOS camera is used to obtain images in the near infrared region. Background and noise components of the obtained image are removed and the signal to noise ratio is increased to provide information that is suitable for use in inspection.
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