METHOD AND SYSTEM FOR STRUCTURAL ANALYSIS OF AN OBJECT BY MEASURING THE WAVE FRONT THEREOF
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United States of America Patent
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Issued Date -
Nov 1, 2012
app pub date -
Oct 8, 2010
filing date -
Oct 8, 2009
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A system for structural analysis of an object, including a device for generating an input light beam arranged so as to cause the input beam generated to interact with at least one portion of the object, and a device for receiving the output light beam resulting from the interaction between the input beam and the object. In this system, the receiving device include a wavefront analyzer arranged so as to measure the electromagnetic field of the wave of the output beam received, and the generating device has a spatial coherence adapted to that of the receiving device. A structural analysis method implementing such a system is presented.
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