GEM POSITIONING AND ANALYSIS SYSTEM
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United States of America Patent
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Issued Date -
Oct 25, 2012
app pub date -
Oct 20, 2011
filing date -
Apr 20, 2011
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Abstract
A gemstone positioning and analysis system is disclosed for measuring various characteristics of a gemstone. The system includes a narrow band spectrophotometer that allows the authenticity of the gemstone to be determined along with other characteristics of the gemstone. A clear mounting plate is also included that has a series of markings to facilitate centering the gemstone within an analysis chamber. An alignment device is included that has at least one linear pusher and is adapted to automatically center the gemstone at the centermost point of the clear mounting plate.
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