Apparatus and method for measuring electrical parameters of circuit

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United States of America Patent

PATENT NO 9063169
APP PUB NO 20120262153A1
SERIAL NO

13422618

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Abstract

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An apparatus for measuring an electrical parameter of a circuit includes a measuring unit, a plurality of connection terminals and a selection switch. The measuring unit measures the electrical parameter. The selection switch selectively causes a conduction between the selection switch and at least one of the plurality of connection terminals.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL CHENG KUNG UNIVERSITYNO 1 UNIVERSITY ROAD TAINAN CITY 701

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Chao-Yang Tainan, TW 21 249
Yang, Chu-Sing Tainan, TW 3 81

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