STRESS MEASUREMENT DEVICE AND STRESS MEASUREMENT METHOD
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United States of America Patent
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Issued Date -
Oct 4, 2012
app pub date -
Oct 27, 2010
filing date -
Nov 27, 2009
priority date (Note) -
Abandoned
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Abstract
A stress measurement device is arranged such that image processing is carried out with respect to each of a plurality of particles dispersed in an RP model to which light is emitted, movement directions and movement amounts of the respective plurality of particles in the RP model are found, and a three-dimensional stress occurring in the RP model is measured by use of a result of the finding. The stress measurement device includes: a retaining section which retains the RP model while soaking the RP model in a refractive index matching solution having a refractive index that matches a refractive index of the RP model; and a load application mechanism and a load application mechanism which apply a load to the RP model retained by the retaining section.
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