METHOD OF FORMING A HYBRID SPLIT GATE SIMICONDUCTOR

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United States of America Patent

SERIAL NO

13460600

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Abstract

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Method of forming a Hybrid Split Gate Semiconductor. In accordance with a method embodiment of the present invention, a plurality of first trenches is formed in a semiconductor substrate to a first depth. A plurality of second trenches is formed in the semiconductor substrate to a second depth. The first plurality of trenches are parallel with the second plurality of trenches. The trenches of the plurality of first trenches alternate with and are adjacent to trenches of the plurality of second trenches.

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Patent Owner(s)

Patent OwnerAddress
VISHAY-SILICONIX2201 LAURELWOOD ROAD SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Azam, Misbah Ul Fremont, US 4 36
Bobde, Madhur Sunnyvale, US 189 2487
Chen, Qufei San Jose, US 22 406
Gao, Yang San Jose, US 446 6138
Shi, Sharon San Jose, US 19 364
Terrill, Kyle Santa Clara, US 71 884

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