PLASMA PROCESSING APPARATUS

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United States of America Patent

APP PUB NO 20120216955A1
SERIAL NO

13401115

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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According to one embodiment, a plasma processing apparatus that includes a process target holding portion and a plasma generating unit in a chamber, and processes a process target by using generated plasma is provided. An yttrium oxide film is formed on an inner wall of the chamber and a surface of a structural member in the chamber on a generation region side of the plasma. The yttrium oxide film includes yttrium oxide particles, has a film thickness of 10 μm or more and 200 μm or less, has a film density of 90% or more, and is such that yttrium oxide particles, which are present in a unit area 20 μm×20 μm and whose grain boundary is confirmable, are 0 to 80% in area ratio.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBA1-1 SHIBAURA 1-CHOME MINATO-KU TOKYO 105-0023
TOSHIBA MATERIALS CO LTD8 SHINSUGITA-CHO ISOGO-KU YOKOHAMA-SHI KANAGAWA

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ETO, Hideo Mie, JP 34 469
Hashiguchi, Hisashi Mie, JP 6 75
Ito, Atsushi Mie, JP 530 5086
Saito, Makoto Mie, JP 389 6319
Sato, Michio Kanagawa, JP 60 2949

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