High Aspect Ratio Patterning of Silicon

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20120214066A1
SERIAL NO

13398442

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Abstract

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A silicon nanowire array including a multiplicity of silicon nanowires extending from a silicon substrate. Cross-sectional shape of the silicon nanowires and spacing between the silicon nanowires can be selected to maximize the ratio of the surface area of the silicon nanowires to the volume of the nanowire array. Methods of forming the silicon nanowire array include a nanoimprint lithography process to form a template for the silicon nanowire array and an electroless etching process to etch the template formed by the nanoimprint lithography process.

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CITIBANK N A388 GREENWICH STREET NEW YORK NY 10013

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Donaldson, Darren D Austin, US 3 20
Miller, Michael N Austin, US 48 790
Schmid, Gerard M Rensselaer, US 35 341
Singh, Vikramjit Austin, US 113 1087
Sreenivasan, Sidlgata V Austin, US 214 5594
Wan, Fen Austin, US 49 286
Xu, Frank Y Round Rock, US 174 2481

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