Low Power Scan-Based Testing
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United States of America Patent
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Issued Date -
Aug 16, 2012
app pub date -
Feb 2, 2012
filing date -
Feb 2, 2011
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
In a low power scan-based testing process, the loading of a test pattern may involve only a portion of the scan chains and the capturing of test response data for the test pattern may involve another portion of the scan chains. The two portions of the scan chains may be determined based on test patterns applied before and after the current test pattern. Clock gating circuitry may be used to select the two portions of the scan chains.
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