INTERFEROMETER
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United States of America Patent
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Issued Date -
Aug 16, 2012
app pub date -
Mar 30, 2010
filing date -
Mar 30, 2009
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The light from the light source of the wideband light is reflected by VIPA so that reflection distance varies step by step. In VIPA, the light that phase changed is generated depending on the depth of the step. A interference profile is measured by this reflected light and optical path length modulator by synthetic light with the generated optical frequency comb. The interferometer does not have a movable scanning mechanism, and the operation of the Fourier transform is unnecessary. Thus, it has the measurement of the short time. The measurement of the coaxial tomography and the one-dimensional coaxial tomography of the depth direction is possible. The measurement of the two-dimensional coaxial tomography of the depth direction is possible.
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