Method and System for Analysis of an Object
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United States of America Patent
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Issued Date -
Aug 9, 2012
app pub date -
Dec 21, 2011
filing date -
Dec 22, 2010
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The invention provides a method and system for analysing the physical properties of an object using a computing device, to any desired accuracy and spatial resolution with a degree of certainty and no longer restricted by the floating point limitations of the computing device. The system and method of the invention employs a method of scaling which uses differing scales for individual rows of arrays, and by further using differing scales for individual columns of the arrays. This method allows for the removal of errors in the calculation of property values so that the accuracy of the resultant physical property distribution may be known with a degree of certainty and no longer restricted by the floating point limitations of the computing device.
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