INSTRUMENTATION FOR MEASUREMENT OF CAPACITANCE AND RESISTANCE AT HIGH RESISTANCE VALUES WITH IMPROVED DYNAMIC RANGE AND METHOD FOR USING SAME
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United States of America Patent
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Issued Date -
Aug 2, 2012
app pub date -
Jan 31, 2011
filing date -
Jan 31, 2011
priority date (Note) -
Abandoned
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Abstract
A system and methods including a direct ramp measurement method and a free running oscillator method is used to measure electrical properties of a material in contact with a sensor. Digital control of signal generation and switching cover a wider measurement range, but still maintain the relaxation oscillator running in an optimal frequency range. A variable amplitude voltage generator and independently controlled switching levels depend on measurement range and voltage generator level.
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