Method for estimating a radiation dose of an X-ray
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United States of America Patent
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Mar 5, 2013
Grant Date -
Aug 2, 2012
app pub date -
Aug 5, 2011
filing date -
Aug 6, 2010
priority date (Note) -
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Abstract
The present embodiments specify a method and an associated X-ray facility for estimating a radiation dose of an X-ray that is generated by an X-ray source and penetrates an object under examination. First dose values of the X-ray are determined by measurement in an automatic exposure control chamber. A second dose value is determined by estimating the radiation dose that is emitted by an X-ray source in a dead time of the automatic exposure control chamber. The estimated radiation dose is determined by the first dose value and the second dose value last determined being added. The second dose value represents a correction value for a non-measurable dose during the dead time of the automatic exposure control chamber that is taken into account when determining the estimated radiation dose.

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- 15 United States
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- 5 Korea
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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
SIEMENS HEALTHINEERS AG | HENKESTR 127 ERLANGEN 91052 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Walk, Johannes | Buckenhof, DE | 4 | 7 |
Wellnitz, Marcel | Heβdorf, DE | 1 | 2 |
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Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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