MULTI PROBE UNIT FOR ULTRASONIC FLAW DETECTION APPARATUS

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United States of America Patent

APP PUB NO 20120192651A1
SERIAL NO

13393993

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Multi probe unit for an ultrasonic flaw detection apparatus, includes a plurality of probes contacting a surface of an object to be inspected; a plurality of connection members connecting two neighbor probes of the plurality of probes with each other; support members disposed on top portions of the plurality of probes so as to be spaced apart from the plurality of probes; and a pressing member connecting the plurality of probes with the support member and pressing the plurality of probes to the object to be inspected. According to the present invention, a plurality of probes smoothly contacts a flexural surface of an object to be inspected.

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Patent Owner(s)

Patent OwnerAddress
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE267 GAJEONG-RO YUSEONG-GU DAEJEON 34113 34113
INDE SYSTEM CO LTD300 CHEONCHEON-DONG JANGAN-GU SUWON-SI GYEONGGI-DO 430-040

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jang, You Hyun Anyang-si, KR 2 6
Kim, Ki Bok Daejeon, KR 4 7
Kim, Young Gil Daejeon, KR 23 216
Lee, Seung Seok Daejeon, KR 7 31
Shin, Hyun Jae Suwon-si, KR 4 11

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