Controlling Thickness of Residual Layer

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United States of America Patent

SERIAL NO

13429903

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Abstract

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Methods for manufacturing a patterned surface on a substrate are described. Generally, the patterned surface is defined by a residual layer having a thickness of less than approximately 5 nm.

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CITIBANK N A388 GREENWICH STREET NEW YORK NY 10013

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jones, Christopher Ellis Austin, US 13 105
Khusnatdinov, Niyaz Round Rock, US 65 667
LaBrake, Dwayne L Cedar Park, US 41 653
Xu, Frank Y Round Rock, US 174 2481

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