Method for Using a Variable Depletion Region to Determine a Range of the Electromagnetic Spectrum
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United States of America Patent
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Issued Date -
Jul 12, 2012
app pub date -
Jan 10, 2012
filing date -
Jan 10, 2011
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Abandoned
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Abstract
A method for using a depletion region in a solid state spectrometer unit cell or plurality of cells for sensing different wavelengths of electromagnetic radiation at different depths within the substrate of the device. Variable bias voltages on one or more p-n junctions in the device are used so that the depth of the depletion regions are selectively varied. By varying the depletion region thickness of the p-n junctions in the device, the wavelengths absorbed by the semiconductor device and resultant electron-hole pairs collected by the p-n junctions are varied. In one embodiment, the outputs of each of two unit cell p-n junctions are sensed and the difference calculated and output to suitable circuitry for display as representative of a particular range or frequency of the electromagnetic spectrum.
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