Long Range Acquisition and Tracking SWIR Sensor System Comprising Micro-Lamellar Spectrometer

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United States of America Patent

APP PUB NO 20120170024A1
SERIAL NO

13397275

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Abstract

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A sensor system is provided having a precision tracking sensor element and a micro-lamellar spectrometer for determining the wavelength of an electromagnetic source such as a laser designator source. Acquisition sensor elements may be provided and mounted on a rotating base element that rotates about a first axis. The precision tracking sensor elements may be mounted on a hinged or pivoting element or gimbal on the housing and provided with drive means to permit a user to selectively manually or automatically direct it toward a scene target of interest detected by the acquisition sensor elements. At least one of the imaging elements in the precision tracking sensor or acquisition sensors is stacked micro-channel plate focal plane array element.

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Patent Owner(s)

Patent OwnerAddress
PFG IP LLC150 PACIFIC AVENUE SAN FRANCISCO CA 94111

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Azzazy, Medhat Laguna Niguel, US 28 553
Carson, John Corona del Mar, US 29 217
Hsu, Ying San Clemente, US 22 565
Justice, James Newport Beach, US 28 448
Ludwig, David Irvine, US 30 796

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