DEEP-TRENCH SILICON ETCHING AND GAS INLET SYSTEM THEREOF

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United States of America Patent

APP PUB NO 20120138228A1
SERIAL NO

13321794

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Abstract

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A deep-trench silicon etching apparatus, including a reaction chamber and a gas source cabinet, the gas source cabinet is connected to the reaction chamber via two independently controlled gas paths; wherein, a first gas path is used to introduce process gas for etch step from the gas source cabinet into the reaction chamber; a second gas path is used to introduce process gas for deposition step from the gas source cabinet into the reaction chamber. The present invention is used to solve the problems of gas mixture and gas delay occurring when process steps are switched.

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Patent Owner(s)

Patent OwnerAddress
BEIJING MNC CO LTDNO 8 WENCHANG AVENUE BEIJING ECONOMIC-TECHNOLOGICAL DEVELOPMENT AREA BEIJING 100176

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Zhou, Yang Beijing, CN 354 1463

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