Method of characterizing an electrical defect affecting an electronic circuit, related device and information recording medium
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
May 10, 2012
app pub date -
Oct 10, 2011
filing date -
Oct 11, 2010
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
The method according to the invention consists of producing a real cartography of the magnetic field radiated by the circuit placed in a predetermined operating state. It includes the following steps: a) applying a transform to an initial hypothesis on the nature of the defect, to obtain a current hypothesis, b) superimposing the current hypothesis on an initial topology of the circuit to obtain a current topology; c) simulating the magnetic field generated by the current topology, so as to obtain a current simulated cartography; d) estimating the current value of a correlation function between the measured cartography and the current simulated cartography; and e) iterating steps a) to d) to seek a maximum of the correlation function by modifying the value of said characteristic parameter of the defect.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully