Method and Apparatus for Detecting Overlapped Substrates
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United States of America Patent
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Issued Date -
Apr 19, 2012
app pub date -
Jun 28, 2006
filing date -
Jun 28, 2005
priority date (Note) -
Abandoned
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Abstract
An apparatus and method for detection of overlapped substrates, that are at least opaque, analyses a high frequency component caused by speckle for a sudden drop therein. This high frequency component drops dramatically when overlapped substrates are present and therefore allows fast accurate recognition of an overlapped substrate condition. This is useful in many applications including banknote validators.
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