Device for the continuous quality control of applied elements
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United States of America Patent
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Dec 1, 2015
Grant Date -
Apr 12, 2012
app pub date -
Sep 23, 2011
filing date -
Oct 8, 2010
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Abstract
A method for continuous quality control of geometric, structural and functional parameters of an applied element, such as a staple, in printed products. The quality control is realized with the aid of at least one measuring device that comprises at least one measuring head including at least one permanent magnet and at least one giant magneto resistance sensor chip. The applied element is detected with the measuring head and, based thereon, a magnetic image is generated of the condition of the element.
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