Cell measurement system
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United States of America Patent
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Issued Date -
Mar 29, 2012
app pub date -
Feb 1, 2011
filing date -
Sep 24, 2010
priority date (Note) -
Abandoned
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Abstract
A cell measurement system measures changes of frequency and transepithelial electrical resistance of a tested cell sample. The cell measurement system includes a quartz crystal sensing module, an oscillation module, a periodic wave-generation module, a low-pass filtration module, and a control module. The cell measurement system of the present invention can simultaneously measure changes of frequency and transepithelial electrical resistance of a tested cell sample during cell growth so that the growth level and healthy condition of the cells and degree of a monolayer completion of the cells can be determined.
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