METHOD FOR MONITORING ORGANIC DEPOSITS IN PAPERMAKING

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United States of America Patent

SERIAL NO

13304785

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Abstract

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A method for monitoring the deposition of organic deposits from a liquid or slurry in a papermaking process is disclosed. Also disclosed is a method for measuring the effectiveness of inhibitors that decrease the deposition of organic deposits in a papermaking process. The method may involve monitoring the deposition of organic deposits of a liquid or slurry that simulates the conditions of a papermaking process. The methods may comprise the steps of monitoring the rate of deposition of organic deposits; adding an inhibitor that decreases the deposition of organic deposits from the liquid or slurry; and optionally re-measuring the rate of deposition of organic deposits from the liquid or slurry onto the quartz crystal microbalance, with the rates of deposition determined by measuring the vibration frequency of the quartz crystal microbalance.

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Patent Owner(s)

Patent OwnerAddress
NALCO COMPANY1601 W DIEHL DRIVE NAPERVILLE IL 60563-1198

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Duggirala, Prasad Naperville, US 12 80
Sheychenko, Sergey Aurora, US 1 11

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