METHOD FOR ANALYSIS OF NEURITE GROWTH

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United States of America Patent

SERIAL NO

13298433

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Abstract

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A method for the analysis of neurite growth is described, in which a substrate having an array pattern is provided, which has first regions on which neurons and cells similar to neurons can adhere, whereby the first regions are surrounded by second regions, in each instance, on which neurons and cells similar to neurons cannot adhere, whereby neurons or cells similar to neurons adhere only on the first regions of the array, and subsequently, the neurons or cells similar to neurons are exposed to one or multiple or no treatment(s), and during this/these treatment(s) and/or afterwards, the neurite outgrowths from the neurons or cells similar to neurons are analyzed by recognizing and quantifying the connections that are formed between the first regions by means of the neurite outgrowths.

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Patent Owner(s)

Patent OwnerAddress
LEIBNIZ - INSTITUT FUER ANALYTISCHE WISSENSCHAFTEN - ISAS - E VBUNSEN-KIRCHHOFF-STRASSE 11 DORTMUND 44139
FORSCHUNGSGESELLSCHAFT FUER ARBEITSPHYSIOLOGIE UND ARBEITSSCHUTZ E VARDEYSTRASSE 67 44139 DORTMUND

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
, FRIMAT Jean-Philippe Enschede, NL 1 0
, WEST Jonathan Dortmund, DE 1 0
HENGSTLER, Jan Dortmund, DE 5 4
SISNAISKE, Julia Recklinghausen, DE 1 0
VAN, THRIEL Christoph Bottrop, DE 1 0

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