BARRIER STRUCTURES AND METHODS OF FORMING SAME TO FACILITATE SILICON CARBIDE EPITAXY AND SILICON CARBIDE-BASED MEMORY FABRICATION

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United States of America Patent

APP PUB NO 20120056194A1
SERIAL NO

12876028

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Abstract

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Embodiments of the invention relate generally to semiconductors and semiconductor fabrication techniques, and more particularly, to devices, integrated circuits, substrates, wafers and methods to form barrier structures to facilitate formation of silicon carbide epitaxy on a substrate, such as a silicon-based substrate, for fabricating various silicon carbide-based semiconductor devices, including silicon carbide-based memory elements and cells. In some embodiments, a semiconductor wafer includes a silicon substrate, a barrier-seed layer disposed over the silicon substrate, and a silicon carbide layer formed over the barrier-seed layer. The semiconductor wafer can be used to form a variety of SiC-based semiconductor devices. In one embodiment, a silicon carbide-based memory element is formed to include barrier-seed layer, multiple silicon carbide layers formed over the barrier-seed layer, and a dielectric layer formed over the multiple silicon carbide layers.

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Patent Owner(s)

Patent OwnerAddress
QS SEMICONDUCTOR AUSTRALIA PTY LTD120 JOLIMONT ROAD JOLIMONT VIC 3002

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dimitrijev, Sima Shailer Park, AU 7 42
Han, Jisheng Calamvale, AU 6 9
Harrison, Herbert Barry Caloundra, AU 4 9
Hold, Leonie Sadliers Crossing, AU 3 9
Iacopi, Alan Thornlands, AU 4 9
Kong, Fred Kuraby, AU 5 78
Tanner, Philip The Gap, AU 5 346
Wang, Li Berrinba, AU 972 6677

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