METHOD AND DEVICE FOR MEASURING PRESSURE-BASED INDUCTANCE OF ELECTROMAGNETIC TABLET

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United States of America Patent

APP PUB NO 20120049866A1
SERIAL NO

13318686

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The invention relates to a method and a device for measuring pressure-based inductance of an electromagnetic tablet, which relates to the field of computer peripheral input device. The method comprises steps of: measuring a first parameter value when an electromagnetic pen is not operating; measuring a second parameter value when the electromagnetic pen is operating, and inductance value of inductor in a resonance circuit varies with pressure; and calculating the pressure-based inductance based on the first and second parameter values. The device comprises: a resonance circuit comprising an inductor whose inductance value varies with pressure when an electromagnetic pen is operating; a measurement circuit configured to measure a first parameter value when the electromagnetic pen is not operating, to measure a second parameter value when the electromagnetic pen is operating, and to calculate the is pressure-based inductance based on the first and second parameter values, the difference between the second parameter value and the first parameter value being associated with variation of the inductance value. According to the present invention, the pressure-based inductance can be calculated based on the measured first and second parameter values that vary with the inductance, and difficulty and cost for measuring the pressure-based inductance are reduced.

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Patent Owner(s)

Patent OwnerAddress
HANWANG TECHNOLOGY CO LTD100193 NO 5 BUILDING 8 NO THREE NORTHEAST WANG XI ROAD BEIJING HAIDIAN DISTRICT BEIJING CITY BEIJING CITY 100193

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wu, Songlin Beijing, CN 7 10

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