METHOD FOR FORMING SILICON FILM HAVING MICROCRYSTAL STRUCTURE

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United States of America Patent

APP PUB NO 20120040519A1
SERIAL NO

13117722

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Abstract

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A method for forming a silicon film having a microcrystal structure is provided. The method includes following steps. A plasma-enhanced chemical vapor deposition system having a reaction chamber, a top electrode and a bottom electrode is provided. The top electrode and the bottom electrode are opposite and disposed in the reaction chamber. A substrate is disposed on the bottom electrode. A silane gas is applied into the reaction chamber. A silicon film having a microcrystal structure is formed by simultaneously irradiating the silane gas in the reaction chamber by a carbon dioxide laser and performing a plasma-enhanced chemical vapor deposition step.

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Patent Owner(s)

Patent OwnerAddress
BUREAU OF ENERGY MINISTRY OF ECONOMIC AFFAIRS13F NO 2 FUSING N RD JHONGSHAN DISTRICT TAIPEI CITY 104

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
LEE, Ching-Ting Taoyuan County, TW 6 29

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