HIGH FREQUENCY MEASUREMENT SYSTEM
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United States of America Patent
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Issued Date -
Jan 12, 2012
app pub date -
Dec 8, 2009
filing date -
Dec 8, 2008
priority date (Note) -
Abandoned
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Abstract
The invention concerns a high frequency non-linear measurement system for analysing the behaviour of a high frequency device, for example a device for use in a high power, high frequency amplifier, such as an amplifier for use in a mobile telephone network or other telecommunications-related base-station. An embodiment of the invention provides a high frequency non-linear measurement system including one or more multiplexer circuits. Each multiplexer circuit comprises a first signal-combining circuit and a second signal-combining circuit. Each signal-combining circuit comprises a pair of directional couplers connected via a pair of signal filters arranged in parallel.
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