Zero Insertion Force Scrubbing Contact
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United States of America Patent
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N/A
Issued Date -
Dec 29, 2011
app pub date -
Jun 29, 2010
filing date -
Jun 29, 2010
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A contact assembly is described for testing a storage cell with a probe configured to flex in an outward direction, in response to a vertical application of force, to scrub a tab on the storage cell at a zero insertion force. The contact assembly comprises a contact structure configured to flex in an outward direction to scrub and to pierce a tab of the storage cell; a board, wherein a juxtaposition of the board to the contact structure defines an opening configured to receive the tab of the storage cell; and a device configured to move the contact structure, to a position in which the opening is closed, to cause the contact structure to scrub and to pierce the tab on the storage cell.
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