Integrated analysis devices and related fabrication methods and analysis techniques
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United States of America Patent
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Jan 3, 2017
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app pub date -
Jun 5, 2009
filing date -
Jun 2, 2008
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Abstract
Provided are integrated analysis devices having features of macroscale and nanoscale dimensions, and devices that have reduced background signals and that reduce quenching of fluorophores disposed within the devices. Related methods of manufacturing these devices and of using these devices are also provided.
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