Wafer processing method, wafer polishing apparatus, and ingot slicing apparatus

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United States of America Patent

PATENT NO 8758087
APP PUB NO 20110294403A1
SERIAL NO

13114141

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Abstract

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In a wafer processing method, an ingot is sliced into a wafer and the wafer is planarized by polishing a surface of the wafer. When the wafer is planarized, the wafer is disposed on a wafer holder and the wafer is rotated, a heat quantity is applied to a portion of the wafer so as to form a reformed layer at the portion of the wafer, and a polishing tool is brought into contact with the portion of wafer while rotating so as to polish the portion of the wafer.

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Patent Owner(s)

Patent OwnerAddress
DENSO CORPORATION1-1 SHOWA-CHO KARIYA-CITY AICHI-PREF 448-8661

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Inomata, Sumitomo Toyota, JP 10 256
Kano, Fumiyoshi Chiryu, JP 6 156
Koutake, Kyohei Kariya, JP 2 3
Morita, Hiromichi Kariya, JP 6 45
Nagaya, Masatake Seto, JP 28 81
Yamaguchi, Tetsuji Obu, JP 216 2209

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