Circuit for controlling temperature and enabling testing of a semiconductor chip
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United States of America Patent
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Feb 26, 2013
Grant Date -
Nov 10, 2011
app pub date -
May 6, 2010
filing date -
May 6, 2010
priority date (Note) -
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Abstract
A circuit for controlling temperature of a semiconductor chip includes a first heating element that is built into the semiconductor chip. The first heating element generates heat to increase the temperature of the semiconductor chip. The chip also includes a temperature controller that is coupled to the first heating element and built into the semiconductor chip. The temperature controller controls the temperature to enable testing of the semiconductor chip at a desired temperature.
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