METHOD FOR DETERMINING ABSOLUTE LAYOUT PARAMETERS OF OBJECTS, ASSOCIATED COMPUTER PROGRAMME AND CONTROL INSTALLATION
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Oct 27, 2011
app pub date -
Mar 28, 2011
filing date -
Mar 29, 2010
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
This method comprises the following steps: the obtaining (210; 210*) of relative layout parameters, each between two objects of a set of objects; the association (211; 211*), with each relative layout parameter received, of a value, called reliability of the relative layout parameter. It moreover comprises the following loop of steps (212; 212*), executed at least once: the selection (214; 214*) of a working sub-set, as a function of the reliabilities of the relative layout parameters; the determination (230; 230*) of new relative layout parameters, each between an object belonging to the working sub-set and an object external to the working sub-set; the association (232; 232*), with each new determined relative layout parameter, of a reliability calculated from the reliabilities of the relative layout parameters of the objects of the working sub-set. It moreover comprises the supply (231) of absolute layout parameters, each of an object of the set, said parameters being obtained from the new determined relative layout parameters.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully