Method for interferometric detection of surfaces

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United States of America Patent

APP PUB NO 20110261347A1
SERIAL NO

13133659

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The invention relates to a method for imaging a microfabricated device comprising at least one oscillating component. The method comprises stroboscopically illuminating in an interferometric setup said component in synchronized relationship with the excitation of the device, and detecting interference light in synchronized relationship with the illumination and excitation. According to the invention the component is illuminated at a wavelength band which is at least partly transmissible by the component, and the positions of at least two separate surfaces of the component of interest are determined based on the interference light detected at least at two temporal phases of excitation of the device. The invention provides an efficient method for in-depth characterization of micromechanical structures that provide only one-sided access during operation.

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Patent Owner(s)

Patent OwnerAddress
UNIVERSITY OF HELSINKIP O BOX 55 UNIVERSITY OF HELSINKI UNIVERSITY OF HELSINKI FI-00014

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aaltonen, Juha Helsinki, FI 1 7
Haeggstrom, Edward Helsinki, FI 5 46
Hanhijärvi, Kalle Helsinki, FI 2 9
Kassamakov, Ivan Helsinki, FI 8 114
Saarikko, Heimo Helsinki, FI 1 7

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