METHOD OF MONITORING A POTENTIOMETRIC MEASURING PROBE
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United States of America Patent
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May 17, 2011
filing date -
Nov 24, 2008
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Abandoned
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Abstract
Method and system of monitoring a measuring probe which is in contact with a measurement medium and registers a measurement value of the measurement medium, wherein the method comprises determining and evaluating time-dependent values of a first and a second parameter, wherein the first parameter responds faster than the second parameter to changes in a process to which the measurement medium is subjected, and wherein both of the parameters are probe-specific parameters.
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