Simple and stable reference for IR-drop and supply noise measurements
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United States of America Patent
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Oct 28, 2014
Grant Date -
Oct 6, 2011
app pub date -
Nov 18, 2009
filing date -
Dec 5, 2008
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Abstract
Apparatus and method for IR-drop and supply noise measurements in electronic circuits. A first voltage at a point of interest in the circuit is sampled and stored during a quiescent mode of the circuit the voltage is to be measured in. Subsequently, the circuit is brought in an operating mode and a second voltage is sampled and held at the same point of interest. The first and the second voltage are compared and a corresponding voltage signal is passed to a system output.
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