Method And Circuit For Testing And Characterizing High Speed Signals Using An ON-Chip Oscilloscope
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United States of America Patent
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Issued Date -
Sep 29, 2011
app pub date -
Mar 15, 2011
filing date -
Mar 23, 2010
priority date (Note) -
Abandoned
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Abstract
A method and structure for characterizing signals used to operate high speed circuitry on an integrated circuit chip. Signals to be characterized, such as column select signals, sense amplifier enable signals and word line signals, are generated on the chip. Each of these signals has an identical corresponding pattern during successive cycles of an input clock signal. These signals are sampled on the chip with successively delayed versions of the input clock signal, thereby generating a plurality of data samples that represent the patterns of the signals over a cycle of the input clock signal. The data samples are stored in a memory block on the chip, and are subsequently serialized and transferred to a location external to the chip.
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