MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

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United States of America Patent

SERIAL NO

13151229

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Abstract

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A manufacturing method of a semiconductor device includes the steps of carrying a substrate in a processing chamber, bringing the processing chamber into a state at a first pressure by supplying a silicon compound gas which contains carbon and hydrogen into the processing chamber, forming a silicon oxide film on the substrate by irradiating a UV light to the silicon compound gas supplied into the processing chamber in the state kept at the first pressure, and decompression process to bring the processing chamber into a state at a second pressure lower than the first pressure. This makes it possible to form the dense silicon oxide film in the trench with high aspect ratio and small width.

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Patent Owner(s)

Patent OwnerAddress
HITACHI KOSKUSAI ELECTRIC INCTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ohashi, Naofumi Tokyo, JP 148 697
Owada, Nobuo Tokyo, JP 54 902
Taniguchi, Takeshi Toyama, JP 82 1242
Wada, Yuichi Toyama, JP 76 1105

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