TEST PROBE WITH ILLUMINATION
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United States of America Patent
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Issued Date -
Sep 15, 2011
app pub date -
Sep 1, 2010
filing date -
Mar 11, 2010
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The test probe with illumination for working with various electrical test and measurement devices contains a light generation member to project light in front of a test pin of the test probe so that the test probe could be conveniently operated in the dark. According to the present invention, the light generation member is housed in a chamber of the test probe's body member. The light generation member contains a light generation circuit and a battery pack. The light generation circuit has a light generation element and a switch element with a control means exposed outside the body member. By engaging the control means, the light generation element is turned on and off.
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