PROBE FOR ELECTRICAL TEST AND METHOD FOR MANUFACTURING THE SAME, AND ELECTRICAL CONNECTING APPARATUS AND METHOD FOR MANUFACTURING THE SAME
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
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N/A
Issued Date -
Jul 21, 2011
app pub date -
Jan 4, 2011
filing date -
Jan 15, 2010
priority date (Note) -
Abandoned
status (Latency Note)
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Importance

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Abstract
A probe for an electrical test has a foot portion coupled with a board, an arm portion extending laterally from a lower end portion of the foot portion, and a needle tip portion projecting downward from a tip end portion of the arm portion. At least one selected from a group consisting of the foot portion, the arm portion, and the needle tip portion comprises a symbol specifying a position of the probe on the board.
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
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KABUSHIKI KAISHA NIHON MICRONICS | 6-8 KICHIJOJIHONCHO 2-CHOME MUSASHINO-SHI TOKYO 1808508 ?1808508 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
AKINIWA, Takashi | Aomori, JP | 5 | 42 |
# of filed Patents : 5 Total Citations : 42 | |||
NAKAMURA, Daigo | Aomori, JP | 5 | 3 |
# of filed Patents : 5 Total Citations : 3 | |||
SASAKI, Kenji | Aomori, JP | 283 | 3039 |
# of filed Patents : 283 Total Citations : 3039 |
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- H01R Class
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- 14 Age
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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