PROBE FOR ELECTRICAL TEST AND METHOD FOR MANUFACTURING THE SAME, AND ELECTRICAL CONNECTING APPARATUS AND METHOD FOR MANUFACTURING THE SAME

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United States of America Patent

APP PUB NO 20110175635A1
SERIAL NO

12984585

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A probe for an electrical test has a foot portion coupled with a board, an arm portion extending laterally from a lower end portion of the foot portion, and a needle tip portion projecting downward from a tip end portion of the arm portion. At least one selected from a group consisting of the foot portion, the arm portion, and the needle tip portion comprises a symbol specifying a position of the probe on the board.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA NIHON MICRONICS6-8 KICHIJOJIHONCHO 2-CHOME MUSASHINO-SHI TOKYO 1808508 ?1808508

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
AKINIWA, Takashi Aomori, JP 5 42
NAKAMURA, Daigo Aomori, JP 5 3
SASAKI, Kenji Aomori, JP 283 3039

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