Metal Oxide Resistance Based Semiconductor Memory Device With High Work Function Electrode

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United States of America Patent

APP PUB NO 20110175050A1
SERIAL NO

12878861

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Abstract

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Various aspect are directed to a memory device or memory cell with a metal-oxide memory element arranged in electrical series along a current path between at least a first electrode, a metal-oxide memory element adjacent to the first electrode, and a second electrode. The first electrode comprises an electrode material having a first work function. The metal-oxide memory element comprises a metal-oxide material having a second work function. The first work function is greater than the second work function. Thermionic emission characterizes the current through this memory.

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Patent Owner(s)

Patent OwnerAddress
MACRONIX INTERNATIONAL CO LTDNO 16 LI-HSIN RD SCIENCE-BASED INDUSTRIAL PARK HSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Yi-Chou Hsinchu City, TW 60 3187
Chien, Wei-Chih Sijhih City, TW 44 612

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