Resistive memory device and method of fabricating the same

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United States of America Patent

PATENT NO 8344344
APP PUB NO 20110133148A1
SERIAL NO

12773228

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Abstract

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Provided are resistive memory devices and methods of fabricating the same. The resistive memory devices and the methods are advantageous for high integration because they can provide a multilayer memory cell structure. Also, the parallel conductive lines of adjacent layers do not overlap each other in the vertical direction, thus reducing errors in program/erase operations.

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Patent Owner(s)

Patent OwnerAddress
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE(GAJEONG-DONG) 218 GAJEONG-RO YUSEONG-GU DAEJEON 34129 34129

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Choi, Sung-Yool Daejeon, KR 25 114

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