Method of fabricating SOI wafer

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United States of America Patent

APP PUB NO 20110117741A1
SERIAL NO

12926123

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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There is provided a method of fabricating an SOI wafer, the method including: a) preparing a bonded SOI substrate that has a buried oxide layer and an SOI layer formed in this sequence on a circular plate shaped support, and at a peripheral edge portion of the support substrate, has a silicon island region in which the SOI layer is not well formed with scattered defective silicon layer; b) etching a silicon island region defective silicon layer to remove the defective silicon layer scattered in the silicon island region by dry etching; and c) etching a silicon island region buried oxide layer to remove the buried oxide layer in the silicon island region by wet etching.

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Patent Owner(s)

Patent OwnerAddress
OKI SEMICONDUCTOR CO LTD550-1 HIGASHIASAKAWA-CHO HACHIOJI-SHI TOKYO 193-8550

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Okamura, Tomohiro Miyagi, JP 7 18
Okihara, Masao Miyagi, JP 32 365

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