PROBE CARD
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United States of America Patent
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N/A
Issued Date -
Apr 28, 2011
app pub date -
Oct 26, 2010
filing date -
Oct 28, 2009
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A probe card is provided. The probe card detaches or separates a probe assembly and a test signal generator which generates test signals from the tester and the printed circuit board, so as to form a probe system module. The probe system module is secured into a probe card module by one or more securing unit. The probe card module includes the printed circuit board. Control signals from the tester are wirelessly transmitted to the probe system module and drive the probe system module to generate the corresponding test signals. Therefore, the loss or distortion of the test signals due to having longer transmitting distances will be reduced and thus the test quality can be improved.
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