SURFACE MEASUREMENT, SELECTION, AND MACHINING
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United States of America Patent
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Issued Date -
Apr 14, 2011
app pub date -
Oct 9, 2009
filing date -
Oct 9, 2009
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Abandoned
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Abstract
Systems, processes, articles of manufacture, and techniques may be used to measure a surface to be machined. In particular implementations, a representation of a surface to be machined may be determined. Measuring the surface may include measuring a plurality of surface points at each of a plurality of surface measurement locations with a measurement system moving over a surface and measuring the position of the measurement system. Determining a representation of the surface to be machined may include determining an estimated shape for the surface based on the surface measurements at the surface measurement locations. The surface measurements, the surface measurement locations, and the estimated shape may be stored in computer memory for future retrieval and use.
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