Novel process method for post plasma etch treatment

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United States of America Patent

APP PUB NO 20110076853A1
SERIAL NO

12586786

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of fabricating a wafer comprising MEMS devices comprises etching trenches or vias into the wafer using a deep reactive ion etching process wherein this process forms residual polymers on sidewalls of the trenches or vias. The wafer is exposed to a dry-cleaning process wherein residual polymers are removed. The dry-cleaning process comprises hot oven baking, combustion, or laser beam illumination.

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Patent Owner(s)

Patent OwnerAddress
HEADWAY TECHNOLOGIES INC678 S HILLVIEW DRIVE MILPITAS CA 95035

International Classification(s)

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  • 2009 Application Filing Year
  • H01L Class
  • 14618 Applications Filed
  • 11145 Patents Issued To-Date
  • 76.25 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2009201020112012201320142015201620172018201920202021202220230255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mao, Guomin San Jose, US 21 308

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Patent Citation Ranking

  • 2 Citation Count
  • H01L Class
  • 3.01 % this patent is cited more than
  • 14 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges1702407123365539219115410570614515901 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0200400600800100012001400160018002000220024002600

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