METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVCIE HAVING CAPACITOR ELEMENT

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United States of America Patent

SERIAL NO

12890431

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Abstract

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In a complete CMOS SRAM having a memory cell composed of six MISFETs formed over a substrate, a capacitor element having a stack structure is formed of a lower electrode covering the memory cell, an upper electrode, and a capacitor insulating film (dielectric film) interposed between the lower electrode and the upper electrode. One electrode (the lower electrode) of the capacitor element is connected to one storage node of a flip-flop circuit, and the other electrode (the upper electrode) is connected to the other storage node. As a result, the storage node capacitance of the memory cell of the SRAM is increased to improve the soft error resistance.

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Patent Owner(s)

Patent OwnerAddress
ACACIA RESEARCH GROUP LLC767 3RD AVE 6TH FLOOR NEW YORK NY 10017

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HASHIMOTO, Naotaka Tokyo, JP 106 1324
Hoshino, Yutaka Tokyo, JP 61 497
Ikeda, Shuji Tokyo, JP 173 3267

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