HIGH THROUGHPUT SCREENING METHOD AND APPARATUS FOR ANALYSING INTERACTIONS BETWEEN SURFACES WITH DIFFERENT TOPOGRAPHY AND THE ENVIRONMENT
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United States of America Patent
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Issued Date -
Jan 13, 2011
app pub date -
Oct 31, 2008
filing date -
Nov 2, 2007
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Abandoned
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Abstract
The invention is directed to a high throughput screening method for analyzing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.
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