Method and Apparatus for Detecting Density and/or Thickness Variations in Materials Transparent or Partly Transparent to Infrared Radiation
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United States of America Patent
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Issued Date -
Jan 13, 2011
app pub date -
Jan 30, 2009
filing date -
Mar 27, 2008
priority date (Note) -
Abandoned
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Abstract
The invention relates to a method and an apparatus tor detecting density and/or thickness variations in materials transparent or partly transparent to infrared radiation, in which an examination object (1, 10) it arranged between an infrared source (3) and a thermographic camera (2), the examination object (1, 10) being irradiated by the inflated source (3) and the thermographic camera (2) arranged opposite the inflated source (3) detecting and evaluating the Infrared beams from the inflated source (3) passing through the examination object (1, 10).
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