SIGNAL PROCESSING APPARATUS INCLUDING BUILT-IN SELF TEST DEVICE AND METHOD FOR TESTING THEREBY

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United States of America Patent

APP PUB NO 20100318865A1
SERIAL NO

12483726

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Abstract

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A signal processing apparatus according to the present invention includes: a built-in self test device dividing a digital reference clock signal to output an I division signal and a Q division signal, shifting the I division signal and the Q division signal by predetermined angles, converting the shifted I and Q signal into analog signals to output an I testing signal and a Q testing signal; and a signal processing receiving and processing the I testing signal and the Q testing signal.

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Patent Owner(s)

Patent OwnerAddress
INTEGRANT TECHNOLOGIES INC7TH FL LORDLAND EZ TOWER 153 GUMI-DONG BUNDANG-GU GYEONGGI-DO 463-810

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
JEONG, Minsu Gyeonggi-do, KR 21 96
KIM, Jae Wan Gyeonggi-do, KR 70 1627

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